6 article(s) from Schwarz, Udo D
Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis
- Omur E. Dagdeviren and
- Udo D. Schwarz
Beilstein J. Nanotechnol. 2017, 8, 657–666, doi:10.3762/bjnano.8.70
Noncontact atomic force microscopy III
- Mehmet Z. Baykara and
- Udo D. Schwarz
Beilstein J. Nanotechnol. 2016, 7, 946–947, doi:10.3762/bjnano.7.86
Noncontact atomic force microscopy II
- Mehmet Z. Baykara and
- Udo D. Schwarz
Beilstein J. Nanotechnol. 2014, 5, 289–290, doi:10.3762/bjnano.5.31
Advanced atomic force microscopy techniques
- Thilo Glatzel,
- Hendrik Hölscher,
- Thomas Schimmel,
- Mehmet Z. Baykara,
- Udo D. Schwarz and
- Ricardo Garcia
Beilstein J. Nanotechnol. 2012, 3, 893–894, doi:10.3762/bjnano.3.99
Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
- Mehmet Z. Baykara,
- Omur E. Dagdeviren,
- Todd C. Schwendemann,
- Harry Mönig,
- Eric I. Altman and
- Udo D. Schwarz
Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73
Noncontact atomic force microscopy
- Udo D. Schwarz
Beilstein J. Nanotechnol. 2012, 3, 172–173, doi:10.3762/bjnano.3.17
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